Reliability and Radiation Effects in Compound Semiconductors
Johnston, Allan
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. First, it starts with principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for 10 years or more with low failure rates.
Categorias:
Ano:
2010
Editora:
World Scientific
Idioma:
english
Páginas:
375
ISBN 10:
981427710X
ISBN 13:
9789814277105
Arquivo:
PDF, 3.92 MB
IPFS:
,
english, 2010
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